Frequency Dependence of Electroluminescence Measurement in LDPE
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چکیده
منابع مشابه
Frequency Dependence of Capacitance Measurement for Advanced Gate Dielectrics
1. Introduction Capacitance-voltage (C-V) measurements are a fundamental characterization technique for MOS devices. However, as the oxide thickness is reduced and gate dielectrics comprised of stacks of novel materials are employed, CV measurement and analysis are made more complex by the frequency-dependence of the measured capacitance. This paper presents an analysis of the sources of the fr...
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ژورنال
عنوان ژورنال: International Journal of Electrical and Computer Engineering (IJECE)
سال: 2017
ISSN: 2088-8708,2088-8708
DOI: 10.11591/ijece.v7i3.pp1406-1413